The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

May. 19, 2016
Applicant:

Applied Vision Corporation, Cuyahoga Falls, OH (US);

Inventors:

Richard A. Sones, Cleveland Heights, OH (US);

Kris Brumbaugh, Marshallville, OH (US);

Michael Leo Kress, Uniontown, OH (US);

Bryan Murdoch, Stow, OH (US);

Assignee:

Applied Vision Corporation, Cuyahoga Falls, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
G01N 21/90 (2013.01); G01N 2201/0637 (2013.01);
Abstract

A container inspection system is described herein. The container inspection system includes a light source that emits a flash of light when a container is detected as being in an inspection region. The container inspection system further includes a light director element that receives a portion of the flash of light and forms a tapering field of light that illuminates an exterior surface of a sidewall of the container when the container is in the inspection region. The container inspection system further comprises a camera that generates an image of the exterior surface when such surface is illuminated by the tapering field of light. A computing system receives the image and outputs an indication as to whether or not the container is defective based upon the image.


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