The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

May. 30, 2018
Applicant:

Shenzhen University, Shenzhen, CN;

Inventor:

Yonghong Shao, Shenzhen, CN;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/552 (2014.01);
U.S. Cl.
CPC ...
G01N 21/554 (2013.01); G01N 21/553 (2013.01); G01N 2201/063 (2013.01); G01N 2201/10 (2013.01);
Abstract

The present invention provides a surface plasmon resonance (SPR) detection system and method. This system utilizes a detection light path to form a detection image containing incident angle information and wavelength information. During testing, full-spectrum scan is performed first to obtain a resonance wavelength of a sample. Then, partial-spectrum scanning is performed by continuously tracking the resonance wavelength, and the number of scanning points in each scanning cycle is controlled according to specific situation to shorten the scanning time, thereby obtaining the resonance wavelength of the sample in real time. When the refractive index of the sample changes, the corresponding resonance wavelength changes as well; by obtaining the change of the resonance wavelength, variation of the reflective index of the sample is calculated, which is rapid SPR detection of wavelength modulation.


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