The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2019
Filed:
Mar. 23, 2017
Jasco Corporation, Tokyo, JP;
Noriaki Soga, Tokyo, JP;
Tetsuji Sunami, Tokyo, JP;
Tsubasa Asatsuma, Tokyo, JP;
Hiroshi Sugiyama, Tokyo, JP;
Jun Koshobu, Tokyo, JP;
JASCO CORPORATION, Tokyo, JP;
Abstract
An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle θc inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle θc' of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.