The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2019
Filed:
Aug. 10, 2018
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventor:
Tetsuya Nagai, Kyoto, JP;
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01); G01N 21/41 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4133 (2013.01); G01N 21/03 (2013.01); G01N 2021/4146 (2013.01); G01N 2021/4153 (2013.01);
Abstract
Provided are an attachment for liquid sample measurement which is capable of effectively reducing a consumption amount of a liquid sample, a refractive index measuring device and a refractive index measuring method. An attachment () is disposed on a V-block prism () formed on a V-shaped groove () for keeping a sample so as to enter the groove (). A body () of the attachment () forms an enclosing space () for enclosing the liquid sample between the body and a surface of the groove () formed on the V-block prism (), and makes the liquid sample enclosed in the enclosing space () contact directly with the surface of the groove ().