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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10393500 B1

PDFFull Text
Date of Patent:
Aug. 27, 2019

Filed:

Dec. 14, 2015

Interference observation device and interference observation method

Applicant:

Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;

Inventors:

Toyohiko Yamauchi, Hamamatsu, JP;

Hidenao Yamada, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:

Drinker Biddle & Reath LLP

Primary Examiner:

Jonathan M Hansen

Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/45 (2006.01); G02B 21/00 (2006.01); G01N 33/483 (2006.01); G02B 21/06 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G01B 9/0203 (2013.01); G01B 9/02015 (2013.01); G01B 9/02049 (2013.01); G01N 21/45 (2013.01); G01N 33/4833 (2013.01); G02B 21/00 (2013.01); G02B 21/06 (2013.01); G02B 21/361 (2013.01); G01B 9/02042 (2013.01);
Abstract

An interference observation apparatus includes a light source which outputs incoherent light, a beam splitter, a sample holding table, an objective lens, a reference mirror, a lens, an aberration correction plate, a piezo element, a tube lens, a beam splitter, an imaging unit, a photodetector, an image acquisition unit, and a control unit. The control unit obtains an interference intensity of combined light on the basis of a detection signal output from the photodetector, and adjusts an interference optical system to increase the interference intensity.

Find Patent Forward Citations

Yamauchi, Toyohiko. (2019). Interference observation device and interference observation method (U.S. Patent No. 10393500). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10393500

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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