The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2019
Filed:
Dec. 21, 2017
Industrial Technology Research Institute, Hsinchu, TW;
Chin-Ming Chen, Taichung, TW;
Shang-Te Chen, Taichung, TW;
Po-Hsiu Ko, Taichung, TW;
Ren-Hao Lu, Taichung, TW;
Szu-Chia Lin, Yilan, TW;
Meng-Chiou Liao, Yunlin County, TW;
Kuan-Wen Chen, Taichung, TW;
Hsi-Hung Hsiao, Taichung, TW;
Shou-Xuan Chang, Taichung, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Abstract
The disclosure is related to a clamp-type measuring device includes a clamp and an interval measuring module. The clamp includes a guiding rail and two holding arm. Each of holding arms includes a guide part, a connecting part, and a clamping part. The guide part is movably furnished on the guiding rail. Both ends of the connecting part are respectively connected to the guide part and the clamping part. The interval measuring module includes a first measuring element and a second measuring element. The first measuring element and the second measuring element are furnished on the two connecting parts respectively. The first measuring element and the second measuring element are slidable through the two guide parts respectively in order to measure an interval between the two clamping parts. In addition, the disclosure is also related to a measuring method of the clamp-type measuring device.