The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2019

Filed:

Mar. 16, 2017
Applicant:

Amo Development, Llc, Santa Ana, CA (US);

Inventors:

Zsolt Bor, San Clemente, CA (US);

John Tamkin, San Marino, CA (US);

Assignee:

AMO Development, LLC, Santa Ana, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 9/008 (2006.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
A61F 9/0084 (2013.01); A61B 3/10 (2013.01); A61B 3/1225 (2013.01); A61B 3/14 (2013.01); A61F 9/008 (2013.01); A61F 9/00831 (2013.01); A61F 2009/0087 (2013.01); A61F 2009/00844 (2013.01); A61F 2009/00872 (2013.01); A61F 2009/00878 (2013.01); A61F 2009/00889 (2013.01);
Abstract

Embodiments of the invention provide methods and systems for analyzing the ophthalmic anatomy of a patient posterior to the cornea. The method may include scanning a focus of a femtosecond laser beam along a path within the patient's eye. A portion of the path may be disposed posterior to the patient's cornea. The method may also include acquiring a first reflectance image and a second reflectance image associated with the focus disposed respectively at a first location of the path and a second location of the path. The method may further include determining the presence or absence of an ophthalmic anatomical feature of the eye based on a comparison between the first reflectance image and the second reflectance image.


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