The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2019
Filed:
Mar. 09, 2017
National Central University, Taoyuan, TW;
Min-Chun Pan, Taoyuan, TW;
Chin-Sung Chen, Taipei, TW;
Shiou-Bair Lin, Taipei, TW;
Shih-Yao Wang, Taipei, TW;
Jhao-Ming Yu, Taichung, TW;
National Central University, Taoyuan, TW;
Abstract
The present invention provides an inspection apparatus for osseointegration of implants, which comprises an inspection base, a holding end, and an inspection end. The holding end is disposed at one end of the inspection base; the inspection end is disposed at the other end of the inspection base. Beside, the inspection end is disposed on one side of the holding end. The holding end includes a signal processing module and a wireless transmission module therein. The inspection end includes an inspection probe, disposed at one end of the inspection end. The inspection probe includes one or more excitation device and a receiver located on the same side of the inspection probe. According to the present invention, the inspection apparatus detects the condition of an object under inspection in a non-contact manner by using an excitation source. An acquired displacement difference is then transmitted to an electronic apparatus through wireless transmission.