The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Sep. 05, 2017
Toshiba Infrastructure Systems & Solutions Corporation, Kawasaki-shi, JP;
Yoko Yonekawa, Fuchu, JP;
Nobuyuki Kumakura, Sagamihara, JP;
Takahiko Yamazaki, Matsudo, JP;
Tomotaka Ueta, Shibuya, JP;
Toshiba Infrastructure Systems & Solutions Corporation, Kawasaki-shi, JP;
Abstract
To provide a crack analysis device, a crack analysis method, and a crack analysis program capable of correctly evaluating deterioration in a road surface. A crack analysis device includes an image acquisition unit, a crack detector, and a display. The image acquisition unit acquires an image of a road surface. The crack detector detects cracks in which a closed region is formed on the photographed road surface based on the photographed image. The display displays a detection result of the detected cracks; and the crack detector detects the cracks which intersect each other on the road surface to form the closed region.