The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
May. 14, 2018
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Setsuo Yoshida, Inagi, JP;
Shoichiro Oda, Fuchu, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An optical signal-to-noise ratio measurement device includes a measurement unit and a determination unit and measures an optical signal-to-noise ratio of an optical signal including a fixed pattern in a specified cycle. The measurement unit measures an optical signal-to-noise ratio of the optical signal respectively in a plurality of time sections in a measurement period so as to generate a plurality of measured values, a length of the measurement period being the same or substantially the same as a length of the specified cycle. The determination unit selects, from the plurality of measured values generated by the measurement unit, at least one measured value other than a worst measured value in the plurality of measured values, and determines an optical signal-to-noise ratio of the optical signal based on the selected at least one measured value.