The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Oct. 24, 2017
Applicant:

Fuji Electric Co., Ltd., Kanagawa, JP;

Inventors:

Hiroki Wakimoto, Matsumoto, JP;

Yuichi Onozawa, Matsumoto, JP;

Takahiro Tamura, Matsumoto, JP;

Eri Ogawa, Aachen, DE;

Assignee:

FUJI ELECTRIC CO., LTD., Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 29/861 (2006.01); H01L 21/265 (2006.01); H01L 21/324 (2006.01); H01L 29/66 (2006.01); H01L 29/32 (2006.01); H01L 29/36 (2006.01); H01L 29/87 (2006.01); H01L 29/167 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0615 (2013.01); H01L 21/265 (2013.01); H01L 21/26506 (2013.01); H01L 21/26513 (2013.01); H01L 21/324 (2013.01); H01L 29/32 (2013.01); H01L 29/36 (2013.01); H01L 29/66121 (2013.01); H01L 29/66136 (2013.01); H01L 29/861 (2013.01); H01L 29/87 (2013.01); H01L 29/167 (2013.01);
Abstract

To prevent an intermediate region from contacting a cathode electrode even if a cathode region is partially defective. There is provided a semiconductor device with a semiconductor substrate that has a field stop region where first impurities of a first conduction type are implanted, an intermediate region that is formed on a back surface side of the field stop region and where second impurities of a second conduction type are implanted, and a cathode region of the first conduction type that is formed on a back surface side of the intermediate region. In a back surface of the semiconductor substrate, a concentration of the first impurities is higher than a concentration of the second impurities.


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