The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Nov. 10, 2015
Applicant:

Landmark Graphics Corporation, Houston, TX (US);

Inventors:

Jeffrey Marc Yarus, Houston, TX (US);

Rae Mohan Srivastava, Toronto, CA;

Genbao Shi, Sugar Land, TX (US);

Veronica Liceras, Katy, TX (US);

Yogendra Narayan Pandey, Houston, TX (US);

Zhaoyang Wang, Houston, TX (US);

Assignee:

Landmark Graphics Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/20 (2006.01); G01V 99/00 (2009.01); G06F 17/50 (2006.01); E21B 41/00 (2006.01); E21B 43/26 (2006.01); G06T 1/60 (2006.01);
U.S. Cl.
CPC ...
G06T 17/205 (2013.01); E21B 41/00 (2013.01); E21B 43/26 (2013.01); G01V 99/00 (2013.01); G06F 17/5018 (2013.01); G06F 17/5009 (2013.01); G06T 1/60 (2013.01); G06T 2215/16 (2013.01);
Abstract

Fracture networks are simulated using a large triangle mesh size for large fractures and a smaller triangle mesh size for small fractures. Input data defining parameters of one or more fractures are input, the fractures being comprised of a triangle mesh. A first triangle mesh size for the fractures is determined based upon the input data. A second smaller triangle mesh size is then determined based upon the input data. The fracture network is then simulated using the large and small triangle mesh sizes.


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