The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
May. 31, 2017
Institut National D'optique, Québec, CA;
Simon Turbide, Québec, CA;
INSTITUT NATIONAL D'OPTIQUE, Quebec, Quebec, CA;
Abstract
Synthetic aperture (SA) imaging methods and systems are assisted by three-dimensional (3D) beam scanning imaging, for example scanning lidar. The methods can include concurrently acquiring an SA image and a 3D scanning image of a target region, determining an elevation map of the target region from the 3D scanning image, and processing the SA image based on the elevation map to provide or enhance 3D imaging capabilities in the SA image. In some implementations, the SA image is a two-dimensional (2D) SA image and the elevation map is used to orthorectify the 2D SA image. In other implementations, the SA image is a phase-wrapped 3D SA image resulting from the combination of two or more 2D SA images and the elevation map is used to perform phase unwrapping on the phase-wrapped 3D SA image.