The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Jun. 28, 2016
Abbyy Development Llc, Moscow, RU;
Ivan Germanovich Zagaynov, Moscow oblast, RU;
Vasily Vasilyevich Loginov, Moscow, RU;
Stepan Yurievich Lobastov, Kirovskaya oblast, RU;
ABBYY PRODUCTION LLC, Moscow, RU;
Abstract
The current document is directed to automated methods and systems, controlled by various constraints and parameters, that identify contours in digital images, including curved contours. Certain of these parameters constrain contour identification to those contours in which the local curvature of a contour does not exceed a threshold local curvature and to those contours orthogonal to intensity gradients of at least threshold magnitudes. The currently described methods and systems identify seed points within a digital image, extend line segments from the seed points as an initial contour coincident with the seed point, and then iteratively extend the initial contour by adding line segments to one or both ends of the contour. The identified contours are selectively combined and filtered in order to identify a set of relevant contours for use in subsequent image-processing tasks.