The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Nov. 16, 2015
Applicant:

Facebook, Inc., Menlo Park, CA (US);

Inventor:

Yin Wang, Redwood City, CA (US);

Assignee:

Facebook, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00476 (2013.01); G06T 7/0002 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Systems, methods, and non-transitory computer-readable media can acquire a first map that represents a particular geographical region. The first map can be associated with an image map. A first vector map can be generated based on the image map with which the first map is associated. A second map that represents the particular geographical region can be acquired. The second map can be different from the first map and can be associated with a second vector map. One or more quantitative evaluations for at least one of the first map or the second map can be provided based on the first vector map and the second vector map.


Find Patent Forward Citations

Wang, Yin. (2019). Systems and methods for providing quantitative evaluation of map quality (U.S. Patent No. 10387722). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10387722

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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