The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Feb. 21, 2017
Applicant:
Sap SE, Walldorf, DE;
Inventors:
Ramshankar Venkatasubramanian, Santa Clara, CA (US);
Dirk Wodtke, Aptos, CA (US);
Ramprasad Rai, Palo Alto, CA (US);
Brendan Bowles, Santa Clara, CA (US);
Assignee:
SAP SE, Walldorf, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2019.01); G06F 16/25 (2019.01); G06F 16/28 (2019.01); G06Q 10/00 (2012.01); G06Q 10/06 (2012.01); G06Q 10/08 (2012.01);
U.S. Cl.
CPC ...
G06F 16/254 (2019.01); G06F 16/288 (2019.01); G06Q 10/00 (2013.01); G06Q 10/063 (2013.01); G06Q 10/0833 (2013.01);
Abstract
A system includes determination of a first measure value associated with a first physical space and a first time period within the analytical data, dynamic determination of a time-dependent association between a first entity or event and the first physical, dynamic mapping of the first measure value to the first entity or event based on the time-dependent association, and presentation of the first measure value in association with the first entity or event.