The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Mar. 02, 2017
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Leonid Baryudin, San Jose, CA (US);

Wenzhou Chen, Cupertino, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/16 (2006.01); G06F 3/06 (2006.01); G11C 16/16 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G06F 13/1689 (2013.01); G06F 3/064 (2013.01); G06F 3/0613 (2013.01); G06F 3/0634 (2013.01); G06F 3/0647 (2013.01); G06F 3/0679 (2013.01); G11C 16/16 (2013.01); G11C 16/26 (2013.01);
Abstract

The following description is directed to managing a nonvolatile medium. The nonvolatile medium can be organized as a plurality of storage units. In one example, a method can include measuring read latencies for the individual storage units of the nonvolatile medium. A probability distribution of future read latencies for the nonvolatile medium can be estimated based on the measured read latencies for the individual storage units of the nonvolatile medium. Information can be moved from a particular storage unit of the nonvolatile medium to a different storage unit of the nonvolatile medium based on the estimated probability distribution of future read latencies for the nonvolatile medium.


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