The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Oct. 06, 2017
Applicant:

Salesforce.com, Inc., San Francisco, CA (US);

Inventors:

James Bock Wunderlich, Burlingame, CA (US);

George Murnock, Firestone, CO (US);

Josh Kaplan, Orinda, CA (US);

Michael Dwayne Miller, Boulder, CO (US);

Mark Wilding, Issaquah, WA (US);

Assignee:

salesforce.com, inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/00 (2006.01); H04L 29/08 (2006.01); H04L 12/26 (2006.01); G06F 11/36 (2006.01); G06F 21/62 (2013.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3688 (2013.01); G06F 21/62 (2013.01); H04L 43/50 (2013.01); H04L 67/1097 (2013.01); H04L 67/14 (2013.01); H04L 67/18 (2013.01);
Abstract

Apparatuses and techniques to utilize a scratch organization as a unit of virtualization. Potential hosts for a scratch organization are evaluated. The potential hosts include at least the first group of hardware processing devices and a second group of the plurality of hardware processing devices to provide remote client computing environments. A target host is selected from the potential hosts. The scratch organization to be hosted by the target host is generated. Data is loaded from a test source that is not the subject organization into the scratch organization. One or more test operations are performed on the scratch organization using the loaded data with the target host. The scratch organization is destroyed on the selected host after the one or more test operations have been performed.


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