The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Dec. 22, 2016
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Jun Wu, Shanghai, CN;

Eric Wu, Shanghai, CN;

Haitao Zhou, Shanghai, CN;

Yourong Wang, Shanghai, CN;

Wei Wang, Westborough, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 9/44 (2018.01); G06F 9/46 (2006.01); G06F 13/00 (2006.01); G06F 11/34 (2006.01); G06F 9/54 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 9/542 (2013.01); G06F 11/3024 (2013.01);
Abstract

Techniques are described that provide for determining health of a system and its components and may include: receiving a hierarchical structure including a plurality of levels of nodes representing the system and components of the system; performing first processing that calculates an overall score denoting health of the system, wherein the overall score is determined in accordance with a plurality of other scores for the components in the system, the plurality of other scores being associated with nodes of the hierarchical structure; and displaying, in a user interface, the overall score.


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