The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Dec. 18, 2015
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Michael Christopher Domke, Skaneateles, NY (US);

Jason Howard Messinger, Andover, MA (US);

Sekhar Soorianarayanan, Bangalore, IN;

Thomas Eldred Lambdin, Auburn, NY (US);

Scott Leo Sbihli, Lexington, MA (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G05B 23/00 (2006.01); G05B 23/02 (2006.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G05B 23/00 (2013.01); G05B 23/0208 (2013.01); G06F 11/0709 (2013.01); G06F 11/0751 (2013.01); G06Q 10/20 (2013.01);
Abstract

A collaboration system may include a non-destructive testing (NDT) inspection device that may communicate with at least one other computing device via a computing network. The computing network may communicatively couple a plurality of computing devices and the NDT inspection device may acquire inspection data, establish a communication connection to the at least one other computing device, and send the data to the at least one other computing device. There, the at least one other computing device may analyze the data. After the data is analyzed, the NDT inspection device may receive the analyzed data from the at least one other computing device.


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