The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Nov. 07, 2012
Applicant:

Cypress Semiconductor Corporation, San Jose, CA (US);

Inventors:

Nathan Y. Moyal, West Linn, OR (US);

Dana Jon Olson, Kirkland, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 9/00 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01);
Abstract

A system and method for determining position information. The method includes selecting a column, a first row, and a second row of a capacitive sensor array. The first row and second row intersect with the column of the capacitive sensor array. The method further includes measuring a differential capacitance between the first row and the second row and utilizing the differential capacitance in determining a location of an object proximate to the capacitive sensor array.


Find Patent Forward Citations

Moyal, Nathan. (2019). System and method to measure capacitance of capacitive sensor array (U.S. Patent No. 10386969). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10386969

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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