The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Jan. 27, 2017
Applicant:

Sony Corporation, Tokyo, JP;

Inventor:

Tatsuya Kaneko, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/04 (2006.01); H01L 21/822 (2006.01); H01L 27/04 (2006.01); H03K 5/19 (2006.01);
U.S. Cl.
CPC ...
G06F 1/04 (2013.01); H01L 21/822 (2013.01); H01L 27/04 (2013.01); H03K 5/19 (2013.01);
Abstract

A failure state is correctly determined in a semiconductor device which operates in synchronization with a periodic signal. A first periodic signal generation unit generates a first periodic signal. A second periodic signal generation unit generates a second periodic signal from the first periodic signal. A third periodic signal generation unit generates a third periodic signal from the first periodic signal. A determination unit determines whether or not a frequency ratio between a pair of periodic signals in a group is substantially constant for each of a group of the first and second periodic signals, a group of the second and third periodic signals, and a group of the first and third periodic signals. In a case where the ratio is not substantially constant in two groups, a failure part specification unit specifies the periodic signal generation unit corresponding to the periodic signal commonly included in the two groups of the first, second, and third periodic signal generation units as a failure part.


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