The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Aug. 16, 2016
Tibco Software Inc., Palo Alto, CA (US);
Thomas Hill, Tulsa, OK (US);
Daniel W. Scott, Broken Arrow, OK (US);
Vladimir S. Rastunkov, Tulsa, OK (US);
TIBCO SOFTWARE INC., Palo Alto, CA (US);
Abstract
A system, method, and computer-readable medium are disclosed for identifying sources of variation in complex manufacturing processes via a variation identification operation. In certain embodiments, the variation identification operation is performed via a variation identification system. The variation identification operation addresses special class of analytic problems, namely the estimation of variance components and related statistics from very large (big data) hierarchically nested designs of random factors. These types of data structures occur frequently across various industries, and in particular in automated and batch manufacturing where the variability in product quality as measured in final product testing should be related to batches, lots, wafers, suppliers, etc. upstream of the process.