The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Jul. 20, 2016
Hangzhou Hikrobot Technology Co., Ltd, Hangzhou, CN;
Pinjiang He, Hangzhou, CN;
Yong Zhu, Hangzhou, CN;
Wencong Zhang, Hangzhou, CN;
Mingqiang Xie, Hangzhou, CN;
Da Guan, Hangzhou, CN;
Zhenhua Zhang, Hangzhou, CN;
Hangzhou Hikrobot Technology Co., Ltd, Hangzhou, CN;
Abstract
The present application discloses a lens, camera, package inspection system and image processing method. The lens comprises an optical lens and a photosensitive chip, and further comprises an optical filter comprising a first filter portion and a second filter portion and disposed between the optical lens and the photosensitive chip, wherein a first object point is imaged on the photosensitive chip through the optical lens and the first filter portion, and a second object point is imaged on the photosensitive chip through the optical lens and the second filter portion, the first filter portion having a thickness greater than that of the second filter portion. The technical problem of a lens in relevant art having a relatively small DOF is solved by the present application.