The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Dec. 26, 2017
Nuctech Company Limited, Beijing, CN;
Shuwei Li, Beijing, CN;
Qingjun Zhang, Beijing, CN;
Ziran Zhao, Beijing, CN;
Junxiao Wang, Beijing, CN;
Xiang Zou, Beijing, CN;
Bozhen Zhao, Beijing, CN;
Lifeng Sun, Beijing, CN;
Yongqiang Wang, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
The present application relates to a dual energy detector and a radiation inspection system. The dual energy detector comprises: a detector module mount and a plurality of detector modules. The detector module includes a higher energy detector array and a lower energy detector array, which are juxtaposedly provided on said detector module mount to be independently irradiated. The present application may simplify the arrangement of the photodiodes and printed circuit boards to which the higher and lower energy detector arrays are connected, such that necessary thickness dimension of the detector module mount is reduced, thereby facilitating the installation and use of the dual energy detector of the present application. On the other hand, the radiation beam in the present application may be independently irradiated to the higher and lower energy detector arrays juxtaposed to each other, which reduces to certain extent the mutual restriction during selection of the higher and lower energy detector arrays.