The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Mar. 04, 2016
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Theresa Bachschmidt, Nuremberg, DE;

Matthias Fenchel, Erlangen, DE;

Bjoern Jakoby, Nuremberg, DE;

Mathias Nittka, Baiersdorf, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/565 (2006.01); G01R 33/48 (2006.01); G01T 1/16 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56563 (2013.01); G01R 33/481 (2013.01); G01T 1/1603 (2013.01);
Abstract

In a method for attenuation correction of emission tomography scan data acquired from an examination object in a combined magnetic resonance emission tomography apparatus, wherein an interference object is situated in the examination region, which causes a magnetic interference field during combined magnetic resonance emission tomography imaging, magnetic resonance scan data of the examination object are acquired by executing a magnetic resonance sequence designed to at least partially compensate inference due to the magnetic interference field. Emission tomography scan data are acquired and an attenuation map is generated using the acquired magnetic resonance scan data. Attenuation correction of the emission tomography scan data is implemented using the generated attenuation map.


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