The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Feb. 09, 2018
Applicant:

Allegro Microsystems, Llc, Manchester, NH (US);

Inventors:

Andreas P. Friedrich, Metz-Tessy, FR;

Andrea Foletto, Annecy, FR;

Nicolas Yoakim, Morges, CH;

Assignee:

Allegro MicroSystems, LLC, Manchester, NH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/30 (2006.01); G01R 33/07 (2006.01); G01R 33/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/077 (2013.01); G01R 33/0005 (2013.01); G01R 33/0094 (2013.01);
Abstract

A magnetic field sensor for sensing a direction of a magnetic field in an x-y plane, can include a first plurality of magnetic field sensing elements operable to generate a first plurality of magnetic field signals and a second plurality of magnetic field sensing elements operable to generate a second plurality of magnetic field signals. The magnetic field sensor can also include at least one sequence switches circuit operable to select ones of the first plurality of magnetic field signals and to select ones of the second plurality of magnetic field signals. The magnetic field sensor can also include a processing circuit operable to combine the selected ones of the first plurality of magnetic field signals and the selected ones of the second plurality of magnetic field signals to generate at least one sequential signal and to process the at least one sequential signal to generate an x-y angle signal indicative of a direction of the magnetic field in the x-y direction. An associated method is described.


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