The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Nov. 29, 2017
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Marvin Leroy Vis, Boulder, CO (US);
Prasanna Madhusudhanan, Boulder, CO (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); H04B 7/26 (2006.01); G01R 29/10 (2006.01); G01R 31/28 (2006.01); H04B 17/10 (2015.01); H04B 17/14 (2015.01); H04B 17/18 (2015.01); H04B 17/391 (2015.01);
U.S. Cl.
CPC ...
G01R 31/2822 (2013.01); G01R 1/0408 (2013.01); G01R 29/105 (2013.01); H04B 17/104 (2015.01); H04B 17/14 (2015.01); H04B 17/18 (2015.01); H04B 17/3911 (2015.01); H04B 7/2668 (2013.01); H04B 17/391 (2015.01);
Abstract
Certain aspects of the present disclosure relate to methods and apparatus for testing millimeter wave devices. The method includes determining a reference antenna response of the DUT for at least one antenna of a test chamber, generating one or more fading coefficients for the at least one antenna based on the determined reference antenna response, applying the generated one or more fading coefficients to at least one signal, and transmitting the at least one signal via the at least one antenna to the DUT in the test chamber.