The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Feb. 29, 2016
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventor:

Allen Montijo, Colorado Springs, CO (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01);
U.S. Cl.
CPC ...
G01R 13/029 (2013.01); G01R 13/0272 (2013.01);
Abstract

A measurement system is provided that performs a trigger data acquisition algorithm. When the measurement system performs the trigger event data acquisition algorithm, it causes a preselected number of digital data samples acquired during a first time window that includes a trigger event and during a second time window that is specified by the user and that is subsequent in time to the first time window to be stored in memory. Digital data samples acquired after the end of the first time window and before the beginning of the second time window are not stored in memory. By not storing digital data samples acquired after the end of the first time window and before the beginning of the second time window, the possibility of overwriting samples that surround the trigger event is prevented and the memory is used very efficiently.


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