The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Dec. 07, 2016
Applicant:

Nanohmics, Inc, Austin, TX (US);

Inventors:

Steve M. Savoy, Austin, TX (US);

Kyle W. Hoover, Austin, TX (US);

Chris W. Mann, Austin, TX (US);

Daniel R. Mitchell, Austin, TX (US);

Jeremy J. John, Austin, TX (US);

Alexander P. Greis, Austin, TX (US);

Assignee:

NANOHMICS, INC., Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54373 (2013.01);
Abstract

Methods and sensors for detection and quantification of one or more analyte in a test sample are described. A response profile of an ion sensor to a control sample of a known interrogator ion is determined. The ion sensor is exposed to a test sample then to a second sample comprising the known interrogator ion, and a test sample response profile of the ion sensor is determined. One or more test sample sensor response profiles are compared with one or more control sensor response profiles for detecting, identifying, and quantifying one or more analytes in the test sample.


Find Patent Forward Citations

Loading…