The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Aug. 31, 2012
Yasuhiro Mito, Kyoto, JP;
Etsuho Kamata, Kameoka, JP;
Hiroshi Miura, Kyoto, JP;
Kenichi Mishima, Kameoka, JP;
Toshinobu Yanagisawa, Kyoto, JP;
Yasuhiro Mito, Kyoto, JP;
Etsuho Kamata, Kameoka, JP;
Hiroshi Miura, Kyoto, JP;
Kenichi Mishima, Kameoka, JP;
Toshinobu Yanagisawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
A data processing system for a chromatograph has an impurity detector including a differential chromatogram creator and a determining section. The differential chromatogram creator calculates a wavelength differential coefficient by differentiating an absorbance spectrum with respect to the wavelength at each point in time of the measurement and creates a differential chromatogram which shows a temporal change in the wavelength differential coefficient. Based on a shape of the thus created differential chromatogram, the determining section determines whether or not a peak of a target component contains an impurity. By this method, whether or not the peak of the target component contains an impurity can be determined with high accuracy, without requiring complex calculations.