The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Jun. 02, 2015
Satake Corporation, Tokyo, JP;
Yoshinari Morio, Tsu, JP;
Hiroki Ishizuki, Hiroshima, JP;
Hideaki Ishizu, Hiroshima, JP;
Hiroaki Takeuchi, Hiroshima, JP;
Tatsuhiko Ochi, Hiroshima, JP;
SATAKE CORPORATION, Tokyo, JP;
Abstract
A method of creating quality grade discrimination criteria in a discrimination device that determines appearance quality grades of granular materials in accordance with the present invention includes a granular material placement step of sorting the granular materials on a per-quality-grade basis and placing the granular materials on an image-capture surface of the image-capturing unit; an imaging data acquisition step of capturing images of the granular materials placed on the image-capture surface by the image-capturing unit and thereby obtaining imaging data; a quality grade information acquisition step of obtaining, on a per-quality-grade basis, pieces of quality grade information on the respective granular materials on the basis of the imaging data; and a quality grade discrimination criteria creation step of creating quality grade discrimination criteria by using the quality grade information obtained on a per-quality-grade basis.