The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Jul. 26, 2017
Applicant:
Michael Trainer, Coopersburg, PA (US);
Inventor:
Michael Trainer, Coopersburg, PA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/53 (2006.01); G01N 15/02 (2006.01); G01N 15/14 (2006.01); G01J 3/44 (2006.01); G01J 3/453 (2006.01); G02B 6/32 (2006.01); G01N 15/04 (2006.01); G01N 21/47 (2006.01); G01J 3/02 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01J 3/0218 (2013.01); G01J 3/4412 (2013.01); G01J 3/453 (2013.01); G01N 15/0211 (2013.01); G01N 15/042 (2013.01); G01N 15/1459 (2013.01); G01N 15/1463 (2013.01); G01N 21/474 (2013.01); G01N 21/53 (2013.01); G02B 6/32 (2013.01); G01N 2015/0053 (2013.01); G01N 2015/025 (2013.01); G01N 2015/0222 (2013.01); G01N 2015/1486 (2013.01); G01N 2015/1493 (2013.01); G01N 2015/1497 (2013.01); G01N 2021/4707 (2013.01);
Abstract
An instrument for measuring characteristics of particles. A particle sample is introduced into a sample cell. The sample particles are subjected to gravitational or centrifugal forces wherein particle motion is dependent upon particle characteristics. The particles are illuminated by an illumination device to produce light scattered by the particles. The light is detected by at least one detector. Characteristics of the particles are determined from the detector signals.