The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Jul. 12, 2017
Applicant:

Infineon Technologies Dresden Gmbh, Dresden, DE;

Inventors:

Thoralf Kautzsch, Dresden, DE;

Heiko Froehlich, Radebeul, DE;

Marco Haubold, Dresden, DE;

Andre Roeth, Dresden, DE;

Maik Stegemann, Pesterwitz, DE;

Mirko Vogt, Dresden, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 9/00 (2006.01); G01L 19/06 (2006.01); G01L 19/14 (2006.01);
U.S. Cl.
CPC ...
G01L 9/0042 (2013.01); G01L 9/0045 (2013.01); G01L 9/0048 (2013.01); G01L 9/0054 (2013.01); G01L 9/0073 (2013.01); G01L 19/0618 (2013.01);
Abstract

A manufacturing method includes providing a semiconductor substrate having a pressure sensor structure; and forming, during a BEOL process (BEOL=back-end-of-line), a metal-insulator-stack arrangement on the semiconductor substrate, wherein the metal-insulator-stack arrangement is formed to comprise (1) a cavity adjacent to the pressure sensor structure and extending over the pressure sensor structure, and (2) a pressure port through the metal-insulator-stack arrangement for providing a fluidic connection between the cavity and an environmental atmosphere, wherein the pressure port has a cross-sectional area, which is smaller than 10% of a footprint area of the pressure sensor structure within the cavity.


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