The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2019

Filed:

Dec. 30, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Takayuki Katsuki, Tokyo, JP;

Raymond H. P. Rudy, Kanagawa-ken, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
F02D 45/00 (2006.01); F02P 5/00 (2006.01); G01M 15/04 (2006.01); G01R 23/16 (2006.01); G01R 19/25 (2006.01);
U.S. Cl.
CPC ...
F02D 45/00 (2013.01); F02P 5/00 (2013.01); G01M 15/048 (2013.01); G01R 19/2509 (2013.01); G01R 23/16 (2013.01);
Abstract

An apparatus obtains a plurality of waveforms representing measurements of a physical characteristic of a machine's operation and a plurality of performance results of the machine corresponding respectively to the plurality of waveforms, each of the performance results indicative of the machine's performance under conditions at which the measurement represented by the corresponding waveform was made. The apparatus divides each of the waveforms into a common plurality of intervals and calculates, for each of at least one of the intervals, an influence value that represents a degree of influence of the plurality of waveforms on the plurality of performance results over the interval.


Find Patent Forward Citations

Katsuki, Takayuki. (2019). Waveform analytics for optimizing performance of a machine (U.S. Patent No. 10385799). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10385799

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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