The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Mar. 09, 2015
Applicants:
The University of Tokyo, Tokyo, JP;
Nikon Corporation, Tokyo, JP;
Inventors:
Takanori Ichiki, Bunkyo-ku, JP;
Hirofumi Shiono, Fujisawa, JP;
Assignees:
THE UNIVERSITY OF TOKYO, Tokyo, JP;
NIKON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01); C12Q 1/02 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
C12M 41/46 (2013.01); C12Q 1/02 (2013.01); G01N 33/5008 (2013.01);
Abstract
A device for measuring activity of cultured cells includes a position detecting unit specifying a position of a cell to be measured, a microchamber controlling unit disposing in the culture container a microchamber which surrounds the cell and forms a measurement space, the measurement space being minute with respect to a volume of the culture container, and a measuring unit measuring environmental factors contained in the measurement space.