The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Jun. 07, 2016
Applicants:
Tintometer, Gmbh, Dortmund, DE;
Perry Palumbo, Fort Collins, CO (US);
Inventor:
Perry Palumbo, Fort Collins, CO (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 40/14 (2006.01); B01D 19/00 (2006.01); G02B 5/04 (2006.01); G01J 1/04 (2006.01); G01J 1/42 (2006.01); G02B 5/00 (2006.01); G02B 27/10 (2006.01); G01N 21/53 (2006.01); G01N 15/06 (2006.01); G01N 21/05 (2006.01);
U.S. Cl.
CPC ...
B01D 19/0042 (2013.01); G01J 1/0477 (2013.01); G01J 1/4257 (2013.01); G01N 21/53 (2013.01); G02B 5/005 (2013.01); G02B 5/04 (2013.01); G02B 27/108 (2013.01); G01N 15/06 (2013.01); G01N 21/534 (2013.01); G01N 2021/054 (2013.01);
Abstract
Embodiments of the present invention include a backscatter reductant anamorphic beam sampler. The beam sampler can be implemented to measure a power of a reference beam generated by an electromagnetic radiation source in proportion to a power of a working beam. The beam sampler can provide astigmatic correction to a divergence of the working beam along one axis orthogonal to a direction of propagation. The beam sampler can further be implemented to prevent backscatter from impinging upon a photodetector of the beam sampler resulting in a reduction of error and instability in measurements taken by the beam sampler.