The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Aug. 25, 2015
Hitachi, Ltd., Tokyo, JP;
Yasutaka Konno, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
In an X-ray scanning apparatus including a photon counting type X-ray detection element, in order to perform counted number correction specialized for pile-up with high accuracy, the X-ray scanning apparatus includes an X-ray detector in which a plurality of photon counting type X-ray detection elements are disposed, each of the X-ray detection elements detecting an incident X-ray photon, classifying energy of the X-ray photon into two or more energy ranges, and counting the X-ray photon, and a correction unit that corrects the counted number in the X-ray detection element, in which the correction unit includes a counting error amount determination part that determines a counting error amount in a counted number due to pile-up according to a pile-up occurrence probability in two or more X-ray photons.