The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Jun. 18, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Nobu Miyazawa, Yokohama, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/02 (2006.01);
U.S. Cl.
CPC ...
A61B 6/025 (2013.01); A61B 6/4452 (2013.01); A61B 6/463 (2013.01); A61B 6/465 (2013.01); A61B 6/467 (2013.01); A61B 6/5205 (2013.01); A61B 6/5211 (2013.01); A61B 6/54 (2013.01); A61B 6/545 (2013.01); A61B 6/563 (2013.01);
Abstract
In tomosynthesis imaging for obtaining a tomosynthesis image from a projected image group captured by irradiating an object with X-rays from a plurality of different angles by using an X-ray generation unit and an X-ray detection unit, whether or not to cause a new icon corresponding to set process conditions to be displayed on a display unit is controlled in accordance with process conditions set by a condition setting unitand process conditions corresponding to a tomosynthesis image already generated by an image processing unit