The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 2019
Filed:
Dec. 16, 2014
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Naoko Yoshida, Kanagawa, JP;
Karin Kuroiwa, Kanagawa, JP;
Assignee:
FUJIFILM CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/07 (2006.01); A61B 5/00 (2006.01); A61B 8/08 (2006.01); G01N 21/47 (2006.01); A61B 5/107 (2006.01);
U.S. Cl.
CPC ...
A61B 5/441 (2013.01); A61B 5/0066 (2013.01); A61B 5/0075 (2013.01); A61B 5/0082 (2013.01); A61B 5/1075 (2013.01); A61B 5/1077 (2013.01); A61B 5/1079 (2013.01); A61B 5/742 (2013.01); A61B 8/0858 (2013.01); G01N 21/4795 (2013.01);
Abstract
A profile of optical reflectance relative to a depth within a depth range from an epidermis to an upper layer of a dermis is created based on a coherence signal obtained by optical coherence tomography, an evaluation index is determined by calculating a difference between reflectance at a local minimum point and reflectance at a second local maximum point from the created profile, and skin conditions are evaluated based on the evaluation index.