The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Mar. 29, 2016
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Yonsei University—industry Foundation, Seoul, KR;
Hyoung-Ju Ji, Seoul, KR;
Sang-Won Park, Seoul, KR;
Youn-Sun Kim, Gyeonggi-do, KR;
Chung-Yong Lee, Seoul, KR;
Sang-Geun Lee, Seoul, KR;
Abstract
The present disclosure relates to a 5G or pre-5G communication system that will be provided to support a higher data transmission rate beyond a 4G communication system such as LTE. Disclosed is an interference measurement method and device in a flexible duplex system. The method comprises the steps of: determining whether uplink (UL) grant for allocating UL transmission has been received from a base station in a first subframe; when the UL grant has not been received, measuring inter-cell interference for an uplink interference measurement resource (IMR) in at least one second subframe determined by the first subframe; and when the UL grant has been received, measuring inter-cell interference for the uplink interference measurement resource (IMR) in at least one third subframe before a subframe that is indicated by the UL grant.