The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Nov. 07, 2016
Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Deepak Sridhara, Longmont, CO (US);

Ara Patapoutian, Hopkinton, MA (US);

Prafulla B Reddy, Longmont, CO (US);

Jason Charles Jury, Minneapolis, MN (US);

Richard Jay Parshall, Shrewsbury, MA (US);

Assignee:

Seagate Technology LLC, Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/29 (2006.01); G06F 3/06 (2006.01); G06F 11/10 (2006.01); H03M 13/11 (2006.01); H03M 13/15 (2006.01); H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
H03M 13/2948 (2013.01); G06F 3/064 (2013.01); G06F 3/0619 (2013.01); G06F 3/0655 (2013.01); G06F 3/0674 (2013.01); G06F 11/1076 (2013.01); H03M 13/1102 (2013.01); H03M 13/1515 (2013.01); H03M 13/6502 (2013.01);
Abstract

An apparatus may include a circuit that initializes a read operation to read one or more requested data segments of a respective data unit. The circuit may generate equalized combined samples for a failed data segment of the one or more requested data segments based on first samples and second samples. In addition, the circuit may perform iterative outer code recovery for the data unit utilizing the equalized combined samples as samples for the failed data segment.


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