The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Sep. 11, 2018
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Jingwei Xu, Plano, TX (US);
Vijayalakshmi Devarajan, Plano, TX (US);
Gangqiang Zhang, Plano, TX (US);
Angelo William Pereira, Allen, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/1536 (2006.01); H03K 5/15 (2006.01); H02J 7/02 (2016.01); H02J 50/10 (2016.01); H03K 17/687 (2006.01); H02J 7/10 (2006.01); H02M 1/00 (2006.01);
U.S. Cl.
CPC ...
H03K 5/1536 (2013.01); H02J 7/025 (2013.01); H02J 50/10 (2016.02); H03K 5/1508 (2013.01); H03K 17/687 (2013.01); H02J 2007/105 (2013.01); H02M 2001/0058 (2013.01);
Abstract
Methods and apparatus for detecting zero-volt crossing in a field-effect transistor. A comparator compares a drain-to source voltage of the transistor to a threshold voltage. A gate voltage signal of the transistor is provided to a clock input of the comparator such that said gate voltage signal is used to latch a result of said comparison to an output of the comparator. A control function with respect to the transistor is performed based on the value of the comparator output.