The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Nov. 21, 2017
Applicant:

Toyoda Gosei Co., Ltd., Kiyosu-shi, JP;

Inventors:

Tomohiro Miwa, Kiyosu, JP;

Shota Shimonishi, Kiyosu, JP;

Satomi Seki, Kiyosu, JP;

Daisuke Kato, Kiyosu, JP;

Shigeo Takeda, Kiyosu, JP;

Assignee:

TOYODA GOSEI CO., LTD., Kiyosu-Shi, Aichi-Ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 33/50 (2010.01); H01S 5/022 (2006.01);
U.S. Cl.
CPC ...
H01L 33/504 (2013.01); H01L 33/502 (2013.01); H01L 33/507 (2013.01); H01S 5/02276 (2013.01); H01S 5/02228 (2013.01);
Abstract

A light emitting device includes a light emitting element that emits a light having a peak wavelength of not less than 411 nm and not more than 421 nm, and a phosphor that emits a fluorescence having a longer peak wavelength than the peak wavelength of the light emitted from the light emitting element. An emission spectrum of only the light emitting element and an emission spectrum of only the phosphor overlap each other while having an overlap width of not less than 71 nm and not more than 81 nm. The overlap width is defined as a wavelength difference between a long wavelength side point at a 0.1% height of a peak height of the emission spectrum of only the light emitting element and a short wavelength side point at a 0.1% height of a highest peak of the emission spectrum of only the phosphor.


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