The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Jun. 14, 2017
Applicant:
Allegro Microsystems, Llc, Manchester, NH (US);
Inventors:
David J. Haas, Concord, NH (US);
Juan Manuel Cesaretti, Ciudad de Buenos Aires, AR;
Assignee:
Allegro Microsystems, LLC, Manchester, NH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G08B 29/14 (2006.01); G01D 3/08 (2006.01); G01R 33/00 (2006.01); G01R 33/07 (2006.01); G01R 33/09 (2006.01); G08B 21/18 (2006.01); G08B 29/18 (2006.01); H04L 25/49 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G08B 29/14 (2013.01); G01D 3/08 (2013.01); G01R 33/0023 (2013.01); G01R 33/07 (2013.01); G01R 33/09 (2013.01); G08B 21/182 (2013.01); G08B 29/185 (2013.01); H04L 25/4902 (2013.01); G01R 31/2829 (2013.01);
Abstract
A sensor integrated circuit includes at least two processing channels responsive to the same or different analog input signals to generate respective processed signals. The two processing channels are non-homogenous and, in some embodiments have different processing accuracies. A checker circuit receives the first and second processed signals and is configured to detect a fault in the sensor integrated circuit when the first and second processed signals differ from each other by more than a predetermined amount.