The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Aug. 31, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Kei Imazawa, Tokyo, JP;

Takaharu Matsui, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 21/04 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G08B 21/0423 (2013.01); G06K 9/00664 (2013.01); G06K 9/00771 (2013.01); G08B 21/0476 (2013.01);
Abstract

The monitoring apparatus includes: a processing unit and a data storage unit, in which the data storage unit stores image data of a work situation including a worker and a work object and model data including data indicating that a combination of a positional relationship between an area of the worker and an area of the work object has appeared in the past, and in which the processing unit includes a recognition unit that recognizes the areas of the worker and the work object from the input image, a combination area specification unit that specifies the combination of the positional relationship of the recognized areas of the worker and the work object, a model acquisition unit that acquires the model data from the data storage unit, and an abnormality degree calculation unit that calculates an abnormality degree in the combination of the areas of the worker and the work object.


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