The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Feb. 16, 2016
Applicant:
University of Surrey, Surrey, GB;
Inventors:
Hongying Lilian Tang, Surrey, GB;
Su Wang, Surrey, GB;
Assignee:
UNIVERSITY OF SURREY, Surrey, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 3/0016 (2013.01); A61B 3/12 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30041 (2013.01);
Abstract
An image analysis method and an image processing apparatus are disclosed. The image analysis method comprises receiving a retinal image and identifying at least one candidate object from a plurality of objects within the retinal image. Singular spectrum analysis SSA is performed on the at least one candidate object, to obtain an intensity profile along at least one cross-sectional line through the candidate object. At least one feature from the intensity profile is extracted for classification of the at least one candidate object.