The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Dec. 04, 2017
Applicant:

Aic Innovations Group, Inc., New York, NY (US);

Inventors:

Adam Hanina, New York, NY (US);

Lei Guan, Jersey City, NJ (US);

Assignee:

AIC Innovation Group, Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01); G06K 15/12 (2006.01); G06K 15/00 (2006.01); G06K 7/14 (2006.01);
U.S. Cl.
CPC ...
G06K 7/10722 (2013.01); G06K 7/1413 (2013.01);
Abstract

In general, in some aspects, the subject matter of the present disclosure can be embodied in methods for confirming identity, in which the methods include: outputting a parameter by a reading device, the reading device adapted to read an image displayed on a display of a display device; receiving the parameter output by the reading device by the display device; generating a fractal image at least in accordance with the received parameter by the display device; displaying the generated fractal image on the display of the display device; imaging the displayed fractal image by the reading device; comparing the imaged fractal image to an expected fractal image generated by the reader at least in accordance with the parameter; and confirming that the imaged fractal image and the expected fractal image do not differ by more than a predetermined amount.


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