The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10380311 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 13, 2019

Filed:

Aug. 09, 2016
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventors:

Pragun Goyal, Cambridge, MA (US);

Joseph A. Paradiso, Arlington, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01R 1/067 (2006.01); G01R 31/28 (2006.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G01R 1/06788 (2013.01); G01R 31/2806 (2013.01); G01R 31/2834 (2013.01); G06F 17/50 (2013.01); G06Q 10/00 (2013.01);
Abstract

A system for introspection and annotation of electronic design data includes a tracked probe that interacts with an electronic circuit, a tracking system, schematics, design files, or models for the circuit, electronic design system software, and a user interface. The probe has a sensor that tracks the position of the probe within the circuit. The tracking system receives data from the sensor and translates it into coordinates reflecting the location of the probe within the circuit. The software uses the probe coordinates to locate the position of the probe on the circuit schematic, identify the circuit component at the probe location, and display information about the identified feature. The displayed information preferably includes an annotated version of the circuit schematic. The system may include a measurement or instrumentation device, the probe may include at least one parameter measurement device, and the display may include information derived from the parameter measurements.


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Goyal, Pragun. (2019). System for introspection and annotation of electronic circuit design data (U.S. Patent No. 10380311). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10380311

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