The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Nov. 13, 2015
Applicant:

Airbus Ds Gmbh, Taufkirchen, DE;

Inventor:

Joerg Heitzer, Immenstaad, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 17/13 (2006.01); G06F 17/11 (2006.01); B64G 1/46 (2006.01);
U.S. Cl.
CPC ...
G06F 17/11 (2013.01); B64G 1/46 (2013.01); G06F 17/13 (2013.01); G06F 17/5009 (2013.01); G06F 17/5095 (2013.01);
Abstract

A method for computing self-contamination processes of a spacecraft by means of a data processing device comprising the following steps: receiving a first set of input parameters comprising general definitions of the spacecraft, receiving a second set of input parameters comprising control parameters for the spacecraft orbital data, physics, numeric, and a predetermined accuracy requirement of the computation, computing a self-contamination process of the spacecraft based on the received first and second sets of input data by either evaluating the analytical solution of a basic equation of emission or numerically solving the basic equation of emission for calculating a deposit of molecules outgassed from surfaces of the spacecraft with a numerical solver with the data processing device, wherein the numerical solver applies an adaptive stepsize control based on the preset accuracy requirement of the computation, and outputting the calculated deposit.


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